The simultaneous measurement method of a refractive index distribution and a thickness distribution using low-coherence digital holography with a vertical scanning is proposed. The proposed method consists of a combination of digital holography and low-coherence interferometry. The introduction of a datum plane enables the measurement of both a refractive index distribution and a thickness distribution. By the optical experiment, the potential of the proposed method is confirmed.

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Measured result of the glass slide

Reference
  • Kaho Watanabe, Masashi Ohshima, and Takanori Nomura, “Simultaneous measurement of refractive index and thickness distributions using low-coherence digital holography and vertical scanning,” J. Opt. 16, 045403 (8 pages) (2014).